Physical and electrochemical study of platinum thin films deposited by sputtering and electrochemical methods
In this work platinum thin films deposited by sputtering and electrochemicalmethods were characterized through physical and electrochemical analysis. The as-grown platinum thin films were characterized through X-ray diffraction (XRD), atomic force microscopy (AFM); scanning electronic microscopy (SE...
| Autores Principales: | , , |
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| Formato: | Artículo (Article) |
| Lenguaje: | Inglés (English) |
| Publicado: |
Elsevier
2011
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| Materias: | |
| Acceso en línea: | https://repository.urosario.edu.co/handle/10336/25988 https://doi.org/10.1016/j.apsusc.2011.03.121 |